The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 1996

Filed:

Feb. 28, 1994
Applicant:
Inventors:

Yuichi Haruta, Yokohama, JP;

Kentaroo Sugawara, Yokohama, JP;

Keikichi Yagii, Tama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324757 ; 356401 ; 348 87 ;
Abstract

A process for inspecting an electrode plate having plural electrodes. The process includes the first step of using a rough alignment between the plate to be inspected and the standard inspecting plate so that the two lie on top of each other. One of the plates is then rotated relative to the other by a predetermined small angle. The electrical connection state between the two plates is then determined. A mathematical analysis of the position deviation between the two plates takes place. The analysis is based on the relative positions of the electrode inspected and the corresponding inspecting electrode before and after the rotation.


Find Patent Forward Citations

Haruta, Yuichi. (1996). Process for inspecting electrodes using rotation alignment correction (U.S. Patent No. 5537050). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5537050

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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