Hamamatsu, Japan

Kazuyoshi Ohta


Average Co-Inventor Count = 3.3

ph-index = 5

Forward Citations = 230(Granted Patents)


Location History:

  • Hamamatsu, JP (1996 - 2000)
  • Iwata, JP (2014)

Company Filing History:


Years Active: 1996-2014

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6 patents (USPTO):Explore Patents

Title: Kazuyoshi Ohta: Innovator in Scattering Measurement Technologies

Introduction

Kazuyoshi Ohta is a prominent inventor based in Hamamatsu, Japan. He has made significant contributions to the field of optical measurement technologies, particularly in the area of scattering media. With a total of six patents to his name, Ohta's work has advanced the understanding and measurement of internal properties in various materials.

Latest Patents

Ohta's latest patents include a "Method for measuring scattering absorber" and a "Device for measuring scattering absorber." In the method for measuring a scattering medium, pulse light with a predetermined wavelength is made incident on both a measurement object and a reference scattering medium. The pulse light transmitted inside these media is detected to acquire a light detection signal. The measurement waveform is then acquired based on this detected signal. A parameter of a function showing the theoretical waveform of the measurement object is specified, ensuring that the results of convolution operations on both the theoretical waveform and the measurement waveform are equal. This allows for the calculation of internal information of the scattering medium based on the theoretical waveform.

Another significant patent is the "Method and apparatus for measuring internal property distribution." This method involves making measurement light incident from multiple positions on the surface of a measured object. The light that passes through the object is detected at various light detection positions. A plurality of measurement values obtained from different combinations of light incidence and detection positions are extracted. A mean value of these measured values is calculated to establish a reference value, which is then used to determine the change amount of a predetermined internal property across different regions of the object.

Career Highlights

Kazuyoshi Ohta has worked with notable companies such as Hamamatsu Photonics K.K. and Shizuoka Prefecture. His experience in these organizations has allowed him to develop and refine his innovative measurement techniques.

Collaborations

Ohta has collaborated with esteemed colleagues, including Yukio Ueda and Yutaka Tsuchiya. Their combined expertise has contributed to the advancement of optical measurement technologies.

Conclusion

Kazuyoshi Ohta's contributions to the field of scattering measurement technologies have been invaluable. His innovative patents and collaborative efforts continue to influence the industry and enhance our understanding of optical properties in various materials.

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