Hamamatsu-photonics K.k.

Shizuoka Prefecture

Kazuyoshi Ohta

Yutaka Tsuchiya

Yukio Ueda

Daisuke Yamashita

Tsuneyuki Urakami

Yutaka Yamashita

Mitsuo Hiramatsu

Kenji Yoshimoto

Hiroaki Suzuki

Mamoru Tamura

Motoki Oda

Goro Nishimura

Kimihiko Kato

Takahiro Makino

Sakio Suzuki, Deceased

In a method for measuring a scattering medium, pulse light with a predetermined wavelength is made incident on a scattering medium which is a measurement object and a scattering medium for reference, the pulse light transmitted inside the scattering media is detected to acquire a light detection signal, the measurement waveform is acquired on the basis of the detected light detection signal, a parameter of a function showing the theoretical waveform of the measurement object is specified in such a manner that the result of convolution operation on the theoretical waveform of the measurement object and the measurement waveform of the reference is made equal to the result of convolution operation on the theoretical waveform of the reference and the measurement waveform of the measurement object, and calculation is made for the internal information of the scattering medium on the basis of the theoretical waveform shown by the function.

Method for measuring scattering absorber and device for measuring scattering absorber

A method for measuring an internal property distribution which includes making measurement light incident from a plurality of light incidence positions on a surface of a measured object, detecting the measurement light that has passed through the object, successively or simultaneously, at at least one light detection position out of a plurality of light detection positions on the surface of the object. A plurality of measurement values obtained by a plurality of combinations of the light incidence position and said light detection position are extracted. A mean value of the measured values are calculated to obtain a reference value and a change amount of a predetermined internal property in each of the plurality of regions of the object are calculated using the plurality of measured values obtained. The reference value thereby establishing an internal property change amount distribution in the object.

Method and apparatus for measuring internal property distribution

An apparatus including: a sprayer for inoculating a microbe on a first division divided from at least one sample of a plant to be examined; sample leaving device for leaving a second division divided from the sample not inoculated with the microbe and the first division inoculated with the microbe, for a predetermined period of time under a predetermined condition; first and second photodetector for respectively measuring the quantities of luminescence emitted from the first and second divisions which have been left standing by the sample leaving device; and a computer for comparing the quantities of the luminescence measured by the first and second photodetector, thereby to examine the resistance or susceptibility of the plant to the microbe.

Methods and apparatuses for examining pathogen resistance of plant, for

An arithmetic control mechanism of the present optical CT apparatus calculates first light densities in output portions of an object on the basis of a numerical analysis method, when it is assumed that the object is divided into fine segments and all segments have the same value as an absorption coefficient under predetermined conditions equivalent to an actual measurements; and calculates second light densities in the output portions on the basis of the method, when it is assumed that sequentially selected one of the segments has a specific value as an absorption coefficient under the predetermined conditions. Further, the mechanism calculates, as influences of the segments, ratios of the first to the second light densities, thereby obtaining an influence matrix corresponding to an arrangement of the segments; calculates relative ratios of the third light densities in the output portions on the basis of the actual measurements to the fitst light densities, thereby obtaining a relative ratio matrix corresponding to arrangements of input and output portions of the object; and performs a matrix calculation by using the influence matrix and the relative ratio matrix, thereby obtaining feature data of the segments for reconstructing a tomographic image of the object.

Optical computer tomographic apparatus and image reconstruction method

Light having a predetermined wavelength and various incident angle components to be incident on a surface of a scattering medium to generate an equivalent point light source or a group of equivalent point light sources near or on the surface of the scattering medium, and light diffused during propagation in the scattering medium is detected outside, and considering isotropic light from the equivalent light sources is immediately diffused, the optically detected signal is processed to detect a predetermined parameter which is primary information and this predetermined parameter is processed to measure internal information which is secondary information in the scattering medium with high accuracy.

Method for measuring internal information in a scattering medium and

Optical pulses emitted from an optical pulse source is incident on a living tissue and is input to an optical sampling unit. An optical sampling unit detects intensities, f, of optical pulses detected at the respective timings of trigger signals input from a delay unit. A first accumulator calculates products, t.multidot.f, of the intensities f and the delay times t from the delay unit. A second accumulator accumulates the light intensities f. An average optical pathlength calculating unit calculates an average optical pathlength using the accumulation results as the products t.multidot.f and the intensities f. An SO.sub.2 value calculating unit calculates a ratio of V.sub.HbO2 to V.sub.Hb from the average optical pathlength to calculate an SO.sub.2 value.

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Hamamatsu, Japan

Kazuyoshi Ohta