The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2000
Filed:
May. 09, 1997
Hamamatsu Photonics K.K., Hamamatsu, JP;
Abstract
A method for measuring an internal property distribution which includes making measurement light incident from a plurality of light incidence positions on a surface of a measured object, detecting the measurement light that has passed through the object, successively or simultaneously, at at least one light detection position out of a plurality of light detection positions on the surface of the object. A plurality of measurement values obtained by a plurality of combinations of the light incidence position and said light detection position are extracted. A mean value of the measured values are calculated to obtain a reference value and a change amount of a predetermined internal property in each of the plurality of regions of the object are calculated using the plurality of measured values obtained. The reference value thereby establishing an internal property change amount distribution in the object.