The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 1997

Filed:

Dec. 01, 1994
Applicant:
Inventors:

Yutaka Tsuchiya, Hamamatsu, JP;

Kazuyoshi Ohta, Hamamatsu, JP;

Tsuneyuki Urakami, Hamamatsu, JP;

Assignee:

Hamamatsu Photonics K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; A61B / ; A61B / ;
U.S. Cl.
CPC ...
356446 ; 356 73 ; 128633 ; 128664 ; 128665 ;
Abstract

Light having a predetermined wavelength and various incident angle components to be incident on a surface of a scattering medium to generate an equivalent point light source or a group of equivalent point light sources near or on the surface of the scattering medium, and light diffused during propagation in the scattering medium is detected outside, and considering isotropic light from the equivalent light sources is immediately diffused, the optically detected signal is processed to detect a predetermined parameter which is primary information and this predetermined parameter is processed to measure internal information which is secondary information in the scattering medium with high accuracy.


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