Company Filing History:

20 out of 2,931

Hamamatsu-photonics K.k.

patents

6 out of 134

Hamamatsu Photonics Kabushiki Kaisha

patents

1 out of 255

Research Development Corporation of Japan

where one patent can have more than one assignee

Years Active: 1990-2003

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26 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 6567165 - Concentration measuring method and apparatus for absorption component in scattering medium (2003-05-20),

2. 5811805 - Charged particle guide apparatus and image viewing apparatus for charged (1998-09-22),

3. 5774223 - Optical measuring method and an optical measuring apparatus for (1998-06-30),

4. 5703491 - Voltage detection apparatus (1997-12-30),

5. 5640247 - Method for measuring internal information in a scattering medium and (1997-06-17),

6. 5583444 - Voltage detection apparatus (1996-12-10),

7. 5499190 - System for measuring timing relationship between two signals (1996-03-12),

8. 5491329 - Photodetecting apparatus having intensity tuneable light irradiating unit (1996-02-13),

9. 5444365 - Voltage measuring apparatus having an electro-optic member (1995-08-22),

10. 5420686 - Polarization interferometer optical voltage detector utilizing movement (1995-05-30),

11. 5384638 - Sampling-type optical voltage detector utilizing movement of (1995-01-24),

12. 5353149 - Apparatus for affecting time-space conversion on a light signal changing (1994-10-04),

13. 5319654 - Pulsed laser beam source device (1994-06-07),

14. 5317577 - Optical wavelength shifter using nonlinear refractive medium disposed (1994-05-31),

15. 5307199 - Optical apparatus (1994-04-26),

Title: Tsuneyuki Urakami: Innovator in Photonics and Charged Particle Technology

Introduction

Tsuneyuki Urakami is a distinguished inventor based in Hamamatsu, Japan, holding an impressive portfolio of 26 patents. His contributions primarily lie in the fields of photonics and charged particle technologies, showcasing his dedication to innovation and advancement in these areas.

Latest Patents

Among his latest patents, Urakami has developed a "Concentration Measuring Method and Apparatus for Absorption Component in Scattering Medium." This innovative apparatus utilizes a light source to generate at least two light rays with predetermined wavelengths, optimizing the measurement of absorption components within a scattering medium. The technology incorporates light incidence means, photodetection means, parameter detection means, and arithmetic processing means to calculate the concentration of the absorption component effectively.

Another notable patent is the "Charged Particle Guide Apparatus and Image Viewing Apparatus for Charged Particles," which introduces an electron-microscope image viewing system capable of measuring the speed or vibration frequency of atomic, magnetic, or electric structures in real time. This sophisticated apparatus features a charged particle source, illuminating electron lens system, image magnifying/projecting lens system, and charged particle detectors, significantly enhancing the capabilities of microscopy in dynamic environments.

Career Highlights

Throughout his career, Urakami has worked with prestigious companies such as Hamamatsu Photonics K.K. and Hamamatsu Photonics Kabushiki Kaisha. His experience in these organizations has allowed him to collaborate with numerous professionals and further his research in cutting-edge technologies.

Collaborations

Tsuneyuki Urakami has collaborated with notable coworkers, including Shinichiro Aoshima and Yutaka Tsuchiya. Together, they have contributed to advancements in their respective fields, driving innovation in photonics and electron microscopy.

Conclusion

Tsuneyuki Urakami stands out as a key figure in the realm of innovations related to photonics and charged particles. With a noteworthy portfolio of patents and significant collaborations, his work continues to shape the future of technology in these disciplines.

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