The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 1998
Filed:
Aug. 27, 1996
Applicant:
Inventors:
Tsuneyuki Urakami, Hamamatsu, JP;
Mitsuharu Miwa, Hamamatsu, JP;
Yutaka Yamashita, Hamamatsu, JP;
Yutaka Tsuchiya, Hamamatsu, JP;
Assignee:
Hamamatsu Photonics K.K., Shiuoka-ken, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01M / ;
U.S. Cl.
CPC ...
356394 ; 356 39 ;
Abstract
An optical measuring method and an optical measuring apparatus are capable of obtaining the true mean time delay of a light waveform within a short time for the purpose of obtaining information on the internal structure of an object. Calculations include a first mean time delay when the light path includes the object, a second mean time delay when the light path does not include the object, and a subtraction of the second mean time delay from the first mean time delay to obtain a true mean time delay.