The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 1998
Filed:
Jan. 17, 1997
Kazuyoshi Ohta, Hamamatsu, JP;
Yukio Ueda, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu, JP;
Abstract
An arithmetic control mechanism of the present optical CT apparatus calculates first light densities in output portions of an object on the basis of a numerical analysis method, when it is assumed that the object is divided into fine segments and all segments have the same value as an absorption coefficient under predetermined conditions equivalent to an actual measurements; and calculates second light densities in the output portions on the basis of the method, when it is assumed that sequentially selected one of the segments has a specific value as an absorption coefficient under the predetermined conditions. Further, the mechanism calculates, as influences of the segments, ratios of the first to the second light densities, thereby obtaining an influence matrix corresponding to an arrangement of the segments; calculates relative ratios of the third light densities in the output portions on the basis of the actual measurements to the fitst light densities, thereby obtaining a relative ratio matrix corresponding to arrangements of input and output portions of the object; and performs a matrix calculation by using the influence matrix and the relative ratio matrix, thereby obtaining feature data of the segments for reconstructing a tomographic image of the object.