The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Sep. 01, 2009
Kenji Yoshimoto, Hamamatsu, JP;
Kazuyoshi Ohta, Iwata, JP;
Daisuke Yamashita, Hamamatsu, JP;
Hiroaki Suzuki, Hamamatsu, JP;
Kenji Yoshimoto, Hamamatsu, JP;
Kazuyoshi Ohta, Iwata, JP;
Daisuke Yamashita, Hamamatsu, JP;
Hiroaki Suzuki, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
In a method for measuring a scattering medium, pulse light with a predetermined wavelength is made incident on a scattering medium which is a measurement object and a scattering medium for reference, the pulse light transmitted inside the scattering media is detected to acquire a light detection signal, the measurement waveform is acquired on the basis of the detected light detection signal, a parameter of a function showing the theoretical waveform of the measurement object is specified in such a manner that the result of convolution operation on the theoretical waveform of the measurement object and the measurement waveform of the reference is made equal to the result of convolution operation on the theoretical waveform of the reference and the measurement waveform of the measurement object, and calculation is made for the internal information of the scattering medium on the basis of the theoretical waveform shown by the function.