This inventor holds 9 USPTO granted patents and 3 published patent applications and 1 EPO patent. Top assignees: Jeol Ltd., Technology Research Association for Future Additive Manufacturing, Kabushiki Kaisha Nihon Micronics. Active years: 2009-2023.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuya Goto. Retrieved from https://idiyas.com/inventor/kazuya-goto
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
USPTO Granted Patents = 9 (Patent Applications = 3)
% Patents Active = 66.7
EPO Patents = 1
Average Co-Inventor Count = 1.2
ph-index = 1
Forward Citations = 4(Granted Patents)
Location History:
- Akishima, JP (2009)
- Tokyo, JP (2009 - 2023)
Company Filing History:
5 out of 832 
Jeol Ltd.
3 out of 51 Technology Research Association for Future Additive Manufacturing
1 out of 232 Kabushiki Kaisha Nihon Micronics
4. 1 out of 372
Tanaka Kikinzoku Kogyo K.k.
where one patent can have more than one assignee
Years Active: 2009-2023
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9 patents (USPTO):Explore Patents
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
3 patents pending:
IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuya Goto. Retrieved from https://idiyas.com/inventor/kazuya-goto
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]