Nirasaki, Japan

Kazunari Ishii


Average Co-Inventor Count = 1.6

ph-index = 4

Forward Citations = 146(Granted Patents)


Location History:

  • Kofu, JP (2001)
  • Nirasaki, JP (2004 - 2014)
  • Yamanashi, JP (2015 - 2018)

Company Filing History:


Years Active: 2001-2018

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10 patents (USPTO):Explore Patents

Title: Kazunari Ishii: Innovator in Device Testing Technology

Introduction

Kazunari Ishii is a prominent inventor based in Nirasaki, Japan. He has made significant contributions to the field of device testing technology, holding a total of 10 patents. His innovative approaches have advanced the methods used in substrate test apparatuses, enhancing the efficiency and accuracy of device testing.

Latest Patents

One of Ishii's latest patents is a device test method that involves a substrate test apparatus. This apparatus includes a mounting table for a substrate with a formed device electrode. The mounting table is movable by X-direction and Y-direction motors, while a probe card is positioned to face the mounting table. A measuring electrode corresponds to the device's electrode, and the probe card features a probe that engages with the measuring electrode. The method limits the maximum torque generated by the motors during electrical characteristic measurements to a predetermined value or less, ensuring precise testing.

Another notable patent is a method for thermal stabilization of a probe card and inspection apparatus. This method allows for rapid adjustment of the probe card to a prescribed temperature by making direct contact with a heat source. The temperature of a heat transfer substrate is adjusted through the mounting table, and the contact load between the probes and the substrate is monitored. The mounting table is controlled to maintain the target load until the probe card reaches thermal stability.

Career Highlights

Kazunari Ishii has worked with notable companies, including Tokyo Electron Limited. His experience in these organizations has contributed to his expertise in device testing technologies and methodologies.

Collaborations

Ishii has collaborated with esteemed colleagues such as Masahito Kobayashi and Masaru Suzuki. Their combined efforts have furthered advancements in the field of device testing.

Conclusion

Kazunari Ishii's innovative contributions to device testing technology have established him as a key figure in the industry. His patents reflect a commitment to improving testing methods, ensuring accuracy and efficiency in device evaluations.

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