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Hamamatsu, Japan

Kazuhiro Hotta

This inventor holds 11 USPTO granted patents and 2 EPO patents. Top assignee: Hamamatsu-Photonics K.k.. Active years: 2010-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazuhiro Hotta. Retrieved from https://idiyas.com/inventor/kazuhiro-hotta

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 11

% Patents Active = 90.9

 

Average Co-Inventor Count = 2.1

ph-index = 2

Forward Citations = 14(Granted Patents)


Company Filing History:

goldMedal11 out of 3,147 
 
Hamamatsu-Photonics K.k.
 patents

Years Active: 2010-2025

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11 patents (USPTO):Explore Patents
1. 12360056 - Semiconductor apparatus examination method and semiconductor apparatus examination apparatus (2025-07-15),
2. 12211199 - Method for inspecting semiconductor and semiconductor inspecting device (2025-01-28),
3. 12094138 - Semiconductor inspection device and semiconductor inspection method (2024-09-17),
4. 12044729 - Semiconductor device examination method and semiconductor device examination device (2024-07-23),
5. 11579184 - Analysis method, analysis device, analysis program, and recording medium for recording analysis program (2023-02-14),
6. 11181361 - Optical measurement method, optical measurement device, optical measurement program, and recording medium for recording optical measurement program (2021-11-23),
7. 9734571 - Image processing method, image processing system, and storage medium storing image processing program (2017-08-15),
8. 9536300 - Image processing method, image processing system, and storage medium storing image processing program (2017-01-03),
9. 7865012 - Semiconductor failure analysis apparatus which acquires a failure observed image, failure analysis method, and failure analysis program (2011-01-04),
10. 7805691 - Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program (2010-09-28),
11. 7752594 - Semiconductor failure analysis apparatus, failure analysis method, failure analysis program, and failure analysis system (2010-07-06),

Title: Kazuhiro Hotta: Innovator in Semiconductor Technology

Introduction

Kazuhiro Hotta is a prominent inventor based in Hamamatsu, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 11 patents. His work focuses on innovative methods and apparatuses for examining semiconductor devices, which are crucial for advancing electronic technology.

Latest Patents

Among his latest patents, Hotta has developed a semiconductor apparatus examination method. This method involves acquiring a first interference waveform based on signals from multiple drive elements in a semiconductor apparatus. It also includes a second interference waveform based on signals from the same drive elements, allowing for a detailed analysis of the device's performance. Another notable patent is a method for inspecting semiconductors, which utilizes machine learning to enhance the resolution of pattern images. This method significantly improves the accuracy of semiconductor inspections, ensuring higher quality in semiconductor manufacturing.

Career Highlights

Kazuhiro Hotta is currently employed at Hamamatsu Photonics K.K., a company renowned for its advancements in optical technologies. His role involves pioneering research and development in semiconductor inspection methods, contributing to the company's reputation as a leader in the field.

Collaborations

Hotta has collaborated with notable colleagues, including Akira Shimase and Tomochika Takeshima. Their combined expertise has fostered innovative solutions in semiconductor technology, enhancing the capabilities of their research and development efforts.

Conclusion

Kazuhiro Hotta's contributions to semiconductor technology through his patents and collaborative efforts have positioned him as a key figure in the industry. His innovative methods continue to influence the future of semiconductor manufacturing and inspection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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