Tokyo, Japan

Kazuhiko Komura

USPTO Granted Patents = 7 

Average Co-Inventor Count = 6.6

ph-index = 3

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2013-2015

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7 patents (USPTO):Explore Patents

Title: Kazuhiko Komura: Innovator in Resist Underlayer Film Technology

Introduction

Kazuhiko Komura is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of resist underlayer film technology, holding a total of seven patents. His work focuses on developing advanced materials and methods that enhance the efficiency of multilayer resist processes.

Latest Patents

Among his latest patents are innovations related to resist underlayer film-forming compositions and pattern-forming methods. One notable patent describes a resist underlayer film-forming composition that includes a polymer with a glass transition temperature (Tg) ranging from 0 to 180°C. This composition is crucial for multilayer resist processes, which involve forming a silicon-based oxide film on the surface of a resist underlayer film and subjecting it to wet etching. Another patent outlines a method for forming a pattern that allows for the easy removal of the resist underlayer film using an alkali liquid while maintaining etching resistance.

Career Highlights

Kazuhiko Komura is currently employed at JSR Corporation, where he continues to innovate in the field of resist technology. His work has been instrumental in advancing the capabilities of resist underlayer films, making them more efficient and easier to work with in various applications.

Collaborations

He collaborates with notable colleagues such as Yushi Matsumura and Satoru Murakami, contributing to a dynamic research environment that fosters innovation and development in their field.

Conclusion

Kazuhiko Komura's contributions to resist underlayer film technology exemplify the impact of innovative thinking in the field of materials science. His patents and ongoing work at JSR Corporation continue to push the boundaries of what is possible in multilayer resist processes.

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