logo

For the Inventor, By the Inventor

Hachioji, Japan

Katsuhiro Matsuyama

This inventor holds 10 USPTO granted patents. Top assignee: Olympus Optical Company, Ltd.. Active years: 1994-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Katsuhiro Matsuyama. Retrieved from https://idiyas.com/inventor/katsuhiro-matsuyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 10

% Patents Active = 100.0

Average Co-Inventor Count = 1.6

ph-index = 8

Forward Citations = 307(Granted Patents)


Location History:

  • Tokyo, JP (1994 - 1995)
  • Hachioji, JP (1996 - 2002)

Company Filing History:

goldMedal10 out of 5,729 
 
Olympus Optical Company, Ltd.
 patents

Years Active: 1994-2002

Loading Chart...
10 patents (USPTO):Explore Patents
1. 6415653 - Cantilever for use in a scanning probe microscope (2002-07-09),
2. 6097197 - Scanning probe microscope (2000-08-01),
3. 5929643 - Scanning probe microscope for measuring the electrical properties of the (1999-07-27),
4. 5883387 - SPM cantilever and a method for manufacturing the same (1999-03-16),
5. 5811017 - Cantilever for use in a scanning probe microscope and method of (1998-09-22),
6. 5753912 - Cantilever chip (1998-05-19),
7. 5583286 - Integrated sensor for scanning probe microscope (1996-12-10),
8. 5386720 - Integrated AFM sensor (1995-02-07),
9. 5367165 - Cantilever chip for scanning probe microscope (1994-11-22),
10. 5319961 - Cantilever chip for use in scanning probe microscope (1994-06-14),

Title: Katsuhiro Matsuyama: Innovator in Scanning Probe Microscopy

Introduction

Katsuhiro Matsuyama is a prominent inventor based in Hachioji, Japan. He has made significant contributions to the field of scanning probe microscopy, holding a total of 10 patents. His innovative work has advanced the capabilities of microscopy technology, enabling more precise measurements and analyses.

Latest Patents

Matsuyama's latest patents include a cantilever designed for use in a scanning probe microscope. This cantilever features a lever portion with a probe made from a semiconductor substrate. The design ensures that the length and thickness directions of the lever are parallel to the top surface of the substrate, while the width direction corresponds to the thickness of the substrate. The probe portion is shaped like a triangular or substantially triangular pyramid, with two faces made of crystal and the remaining face formed through an artificial process. Another notable patent involves a conductive cantilever that supports a conductive probe on its free end, which is oscillated by a piezoelectric element. This setup allows for advanced signal processing and mapping of configuration and potential distribution images of samples.

Career Highlights

Katsuhiro Matsuyama is currently employed at Olympus Optical Company, Ltd., where he continues to innovate in the field of microscopy. His work has been instrumental in enhancing the functionality and accuracy of scanning probe microscopes, making significant impacts in various scientific and industrial applications.

Collaborations

Matsuyama has collaborated with notable colleagues, including Akitoshi Toda and Nobuaki Sakai. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Katsuhiro Matsuyama's contributions to scanning probe microscopy exemplify the spirit of innovation in the field. His patents and collaborative efforts continue to push the boundaries of what is possible in microscopy technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…