Junichi Katane

This inventor holds 24 USPTO granted patents and 5 published patent applications and 1 EPO patent. Top assignees: Hitachi High-Tech Corporation, Hitachi-High-Technologies Corporation, Hitachi-Science Systems, Ltd.. Active years: 2006-2026.

USPTO Granted Patents = 24 (Patent Applications = 5)

% Patents Active = 87.5

EPO Patents = 1

Average Co-Inventor Count = 3.4

ph-index = 4

Forward Citations = 41(Granted Patents)

Location History:

Naka, JP (2006 - 2014)
Tokyo, JP (2017 - 2024)

Company Filing History:

12 out of 1,363

Hitachi High-Tech Corporation

patents

11 out of 2,874

Hitachi-High-Technologies Corporation

patents

2 out of 33

Hitachi-Science Systems, Ltd.

patents

4. 1 out of 3

Hitachi High-Tech Science Systems Corporation

patents

where one patent can have more than one assignee

Years Active: 2006-2026

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24 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12719010 - Charged particle beam device (2026-08-25),

2. 12688992 - Electron beam application device (2026-07-21),

3. 12437958 - Electron beam application device (2025-10-07),

4. 12431325 - Sample image observation device and method for same (2025-09-30),

5. 12400827 - Charged particle beam device (2025-08-26),

6. 12217928 - Electron gun and electron microscope (2025-02-04),

7. 12165828 - Electron gun and electron beam application apparatus (2024-12-10),

8. 11961699 - Charged particle beam device (2024-04-16),

9. 11823861 - Charged particle beam device (2023-11-21),

10. 11756763 - Scanning electron microscope (2023-09-12),

11. 11640897 - Charged particle beam device (2023-05-02),

12. 11430630 - Charged particle beam apparatus (2022-08-30),

13. 11170972 - Scanning electron microscope and method for analyzing secondary electron spin polarization (2021-11-09),

14. 10886101 - Charged particle beam device (2021-01-05),

15. 9824854 - Charged particle beam device, image generation method, observation system (2017-11-21),

Title: Junichi Katane: Pioneering Innovations in Naka, JP

Introduction:

Junichi Katane is a distinguished inventor renowned for his groundbreaking work in the field of charged particle beam devices and scanning electron microscopes. With a total of 16 patents to his name, Katane has left an indelible mark on the world of invention.

Latest Patents:

Among his latest patents is the Charged Particle Beam Device, designed to prevent leakage of magnetic fields during sample observation using a boosting method. Additionally, Katane's Scanning Electron Microscope incorporates a spin detector for accurately measuring secondary electron spin polarization, enabling the assessment of strain within samples.

Career Highlights:

Throughout his career, Junichi Katane has honed his expertise at prestigious companies such as Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation. His innovative contributions have significantly advanced the field of electron microscopy and particle beam technology.

Collaborations:

Katane has had the privilege of collaborating with esteemed coworkers such as Sukehiro Ito and Shinichi Tomita. Together, they have worked on cutting-edge projects that have pushed the boundaries of scientific discovery and technological innovation.

Conclusion:

In conclusion, Junichi Katane stands as a true trailblazer in the world of invention, with a remarkable track record of turning visionary ideas into tangible realities. His passion for innovation and commitment to excellence continue to inspire inventors and creators worldwide, solidifying his legacy as a pioneering figure in the realm of patents and inventions.