The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Mar. 25, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Hideo Morishita, Tokyo, JP;

Takashi Ohshima, Tokyo, JP;

Tatsuro Ide, Tokyo, JP;

Naohiro Kohmu, Tokyo, JP;

Toshihide Agemura, Tokyo, JP;

Yoichi Ose, Tokyo, JP;

Junichi Katane, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/073 (2006.01); H01J 1/34 (2006.01);
U.S. Cl.
CPC ...
H01J 37/073 (2013.01); H01J 1/34 (2013.01); H01J 2237/053 (2013.01); H01J 2237/055 (2013.01); H01J 2237/06333 (2013.01); H01J 2237/188 (2013.01); H01J 2237/24557 (2013.01);
Abstract

The electron gun is provided with a first anode electrode and a second anode electrode to generate an acceleration and deceleration electric field. A lens electric field makes it possible to irradiate a sample with an electron beam emitted from a part outside an optical axis of the photoelectric film without being blocked by a differential exhaust diaphragm. A wide range of electron beams off-optical axis can be used even in a high-brightness photocathode that requires high vacuum. As a result, the photoelectric film and the electron gun can be extended in life, can be stabilized, and can be increased in brightness. Further, it is possible to facilitate a control of emitting electron beams from a plurality of positions on the photoelectric film, a timing control of emitting electron beams from a plurality of positions, a condition control of an electron beam in an electron microscope using electron beams.


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