Webster, NY, United States of America

John Patrick Spence

USPTO Granted Patents = 21 

Average Co-Inventor Count = 2.1

ph-index = 11

Forward Citations = 386(Granted Patents)


Location History:

  • Rochester, NY (US) (1987)
  • Webster, NY (US) (1991 - 2019)
  • Albany, NY (US) (2024)

Company Filing History:


Years Active: 1987-2024

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21 patents (USPTO):Explore Patents

Title: John Patrick Spence: Innovator in Measurement Technologies

Introduction

John Patrick Spence is a notable inventor based in Webster, NY, with an impressive portfolio of 21 patents. His innovative work primarily focuses on advanced systems and methods for measuring dimensions related to objects through the use of digital imagery and ancillary references. Spence’s contributions to the field have made a significant impact, particularly in custom manufacturing and design.

Latest Patents

Two of John Patrick Spence's latest patents are particularly noteworthy. The first patent, titled "System and method of measuring distances related to an object utilizing ancillary objects," outlines a process for measuring distances of a target object within a digital image. The method utilizes ancillary objects and reference objects to determine the dimensions of the target, employing image processing techniques to locate these references based on known patterns and user-input metadata.

The second patent builds on the first, focusing on the construction and delivery of supplemental window materials for fenestration. This innovative system captures digital imagery featuring a target object whose dimensions need to be assessed and subsequently automates the design and manufacturing processes for customized parts, thus enhancing the end-user experience.

Career Highlights

Throughout his career, Spence has worked at prominent companies, including Eastman Kodak Company and Wexenergy Innovations LLC. His experiences in these organizations have enriched his understanding of the practical applications of his inventions, allowing him to merge technology with industry needs effectively.

Collaborations

John Patrick Spence has collaborated with notable coworkers such as John T. Keech and Ronald Myron Wexler. These collaborations have contributed to the development and refinement of his innovative technologies and have fostered a creative environment for the exploration of new ideas.

Conclusion

John Patrick Spence exemplifies the innovative spirit of inventors who strive to enhance measurement technologies through ingenuity and application of science. His dedicated work and substantial patent contributions signify his role as a key player in the evolution of image-based measurement systems, and his legacy will continue to influence future advancements in the field.

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