The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Sep. 25, 2015
Applicant:

Wexenergy Innovations Llc, Rochester, NY (US);

Inventors:

Ronald M. Wexler, Rochester, NY (US);

John P. Spence, Webster, NY (US);

Assignee:

WexEnergy Innovations LLC, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G06T 7/62 (2017.01); G01C 11/04 (2006.01); G01C 3/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/602 (2013.01); G06T 7/62 (2017.01); G01C 3/00 (2013.01); G01C 11/04 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30208 (2013.01);
Abstract

A system and method for measuring distances related to a target object depicted in an image and the construction and delivery of supplemental window materials for fenestration. A captured digital image is obtained containing a scene with a target object whose dimension is to be measured. The digital image may contain a target object dimension identified by one or more ancillary objects and a reference object in the same or different planes. Image processing is performed to find the reference object using known fiducial patterns printed on the reference object, metadata supplied by a user and/or by the detection of colored papers in the scene of the captured image. Adhering objects aid in keeping the reference object applied to an item in the scene such as a wall, while contrast objects aid the image processing to locate the reference object in low contrast reference object/background situations. Once located and measured, the reference object is used to calculate a pixel scale factor used to measure the target object dimensions. Target object dimensions are provided to an automated or semi-automated measurement process, design and manufacturing system such that customized parts are provided to end users.


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