The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Aug. 09, 2000
Applicant:
Inventors:
John T. Keech, Penfield, NY (US);
Donald O. Bigelow, Webster, NY (US);
Mark E. Shafer, Fairport, NY (US);
John P. Spence, Webster, NY (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03C 1/00 ;
U.S. Cl.
CPC ...
G03C 1/00 ;
Abstract
A method of recording a reference calibration target on an APS format photographic element having a reserved area for use by photofinishing apparatus, and a perforation located relative to the reserved area, includes the steps of: generating a reference calibration target having a width no greater than 30.2 mm and a height no greater than 16.7 mm; locating the reserved area of the photographic element relative to the perforation; and recording the reference calibration target within the reserved area.