Johan Frederik Cornelis Van Gurp

Title: Innovations by Johan Frederik Cornelis Van Gurp

Introduction

Johan Frederik Cornelis Van Gurp is a notable inventor based in Berkel en Rodenrijs, Netherlands. He has made significant contributions to the field of electron optics, holding a total of 2 patents. His work focuses on enhancing the performance and testing of electron-optical assemblies.

Latest Patents

Van Gurp's latest patents include innovative techniques and systems. The first patent, titled "Stack alignment techniques," discloses a substrate stack comprising multiple substrates. Each substrate in this stack features at least one alignment opening set, which is aligned to allow a light beam to pass through corresponding openings. Notably, each substrate has at least one alignment opening with a smaller diameter than the corresponding openings in other substrates.

The second patent, "Tool for testing an electron-optical assembly," describes a testing system designed for electron-optical assemblies. This system includes a source of charged particles that emits a beam, an assembly holder for the electron-optical assembly, and a sub-beam detector that captures sub-beams of charged particles transmitted through the assembly.

Career Highlights

Johan Van Gurp is currently employed at ASML Netherlands B.V., a leading company in the semiconductor industry. His work at ASML involves developing advanced technologies that contribute to the efficiency and effectiveness of electron-optical systems.

Collaborations

Throughout his career, Van Gurp has collaborated with talented individuals such as Arjen Benjamin Storm and Aaron Yang-Fay Ayal. These collaborations have fostered innovation and have led to the development of cutting-edge technologies in the field.

Conclusion

Johan Frederik Cornelis Van Gurp is a distinguished inventor whose work in electron optics has led to significant advancements in the industry. His patents reflect his commitment to innovation and excellence in technology.