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For the Inventor, By the Inventor

Underhill, VT, United States of America

Jody John Van Horn

USPTO Granted Patents = 15

Average Co-Inventor Count = 5.3

ph-index = 5

Forward Citations = 241(Granted Patents)


Company Filing History:

goldMedal15 out of 164,108 
 
International Business Machines Corporation
 patents

Years Active: 1997-2017

where 'Filed Patents' based on already Granted Patents

15 patents (USPTO):
1. 9535113 - Diversified exerciser and accelerator (2017-01-03),
2. 9152517 - Programmable active thermal control (2015-10-06),
3. 7759960 - Integrated circuit testing methods using well bias modification (2010-07-20),
4. 7564256 - Integrated circuit testing methods using well bias modification (2009-07-21),
5. 7486098 - Integrated circuit testing method using well bias modification (2009-02-03),
6. 7400162 - Integrated circuit testing methods using well bias modification (2008-07-15),
7. 7298161 - Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability (2007-11-20),
8. 7265561 - Device burn in utilizing voltage control (2007-09-04),
9. 7000162 - Integrated circuit phase partitioned power distribution for stress power reduction (2006-02-14),
10. 6891359 - Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability (2005-05-10),
11. 6763314 - AC defect detection and failure avoidance power up and diagnostic system (2004-07-13),
12. 6618682 - Method for test optimization using historical and actual fabrication test data (2003-09-09),
13. 6351134 - Semiconductor wafer test and burn-in (2002-02-26),
14. 5929651 - Semiconductor wafer test and burn-in (1999-07-27),
15. 5600257 - Semiconductor wafer test and burn-in (1997-02-04),

Title: Jody John Van Horn: Innovator in Semiconductor Testing

Introduction

Jody John Van Horn, an accomplished inventor based in Underhill, Vermont, is known for his significant contributions to the field of semiconductor testing. With a remarkable portfolio of 15 patents, Van Horn has made a profound impact through his innovative methods and technologies aimed at enhancing testing processes.

Latest Patents

Among Van Horn's latest patents are two groundbreaking inventions: the "Diversified Exerciser" and "Accelerator" and the "Programmable Active Thermal Control." The Diverse Exerciser and Accelerator patent presents a method, apparatus, and computer program designed for testing semiconductor products by integrating multiple techniques. This invention allows for the adaptation of various techniques depending on the specific requirements of the testing scenario, facilitating the acceleration of defects that demand higher voltage or temperature than traditional burn-in processes.

The "Programmable Active Thermal Control" patent revolves around test equipment that introduces an interrupt capability to automatic testing. This feature allows for active temperature control of the device under test by utilizing a processor that executes specific computer-executable instructions stored in memory. The capability to run a control pattern during a testing session and restart from the interruption point illustrates a significant advancement in semiconductor testing.

Career Highlights

Jody John Van Horn's career has been closely associated with the International Business Machines Corporation (IBM), where he has contributed to the development of innovative technologies in semiconductor testing. His expertise has positioned him as a thought leader in this niche, earning recognition for advancing the testing methodologies used in the industry.

Collaborations

Throughout his career, Van Horn has collaborated with talented colleagues, including Anne Elizabeth Gattiker and David A Grosch. These partnerships have played a crucial role in fostering innovation and pushing the boundaries of what's possible in semiconductor testing.

Conclusion

Jody John Van Horn continues to be a pivotal figure in the realm of semiconductor innovation. His patents reflect a commitment to enhancing testing methodologies and ultimately contributing to the advancement of technology in the semiconductor field. As he continues to innovate, his work is sure to inspire future developments in the industry.

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