The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Apr. 21, 2011
Harold Chase, Cedar Park, TX (US);
Dennis R. Conti, Essex Junction, VT (US);
James M. Crafts, Warren, VT (US);
David L. Gardell, Fairfax, VT (US);
Andrew T. Holle, Austin, TX (US);
Adrian Patrascu, Austin, TX (US);
Jody J. Van Horn, Underhill, VT (US);
Harold Chase, Cedar Park, TX (US);
Dennis R. Conti, Essex Junction, VT (US);
James M. Crafts, Warren, VT (US);
David L. Gardell, Fairfax, VT (US);
Andrew T. Holle, Austin, TX (US);
Adrian Patrascu, Austin, TX (US);
Jody J. Van Horn, Underhill, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Test equipment provides interrupt capability to automatic testing as a means of actively controlling temperature of the device under test. A processor coupled to memory is responsive to computer-executable instructions contained in the memory. A test socket is coupled to a device under test and coupled to the processor. The processor is configured to interrupt an application pattern running on the device under test. In response to interrupting the application pattern, the processor is configured to cause a control pattern to run on the device under test and then cause the application pattern to restart running from the point of interruption on the device under test.