Changchun, China

Jiazheng Sun

USPTO Granted Patents = 2 

Average Co-Inventor Count = 16.9

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2025

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2 patents (USPTO):Explore Patents

Title: Jiazheng Sun: Innovator in Micro-Nano Impact Indentation Testing

Introduction

Jiazheng Sun is a prominent inventor based in Changchun, China. He has made significant contributions to the field of material property testing through his innovative inventions. With a total of 2 patents, his work focuses on advancing testing methodologies that enhance precision and efficiency.

Latest Patents

Jiazheng Sun's latest patents include a micro-nano impact indentation testing device and method based on cyclic refrigeration. This invention provides a sophisticated approach to material property testing by utilizing a refrigeration device that stabilizes the temperature of the pressure rod and stage. The device is designed to improve the accuracy of low-temperature micro-nano impact indentation testing.

Another notable patent is the rapid dot matrix micro-nano impact indentation testing system. This system features a three-dimensional electric positioning module that allows for in-situ micro-nano impact indentation tests. It incorporates advanced components such as a piezoelectric platform and an imaging module, which collectively enhance indentation precision.

Career Highlights

Jiazheng Sun is affiliated with Jilin University, where he continues to push the boundaries of research and innovation in material testing. His work has garnered attention for its practical applications in various industries, making him a valuable asset to the academic and research community.

Collaborations

Jiazheng collaborates with esteemed colleagues, including Zhichao Ma and Junming Xiong. Their combined expertise contributes to the advancement of innovative testing solutions.

Conclusion

Jiazheng Sun's contributions to micro-nano impact indentation testing exemplify the spirit of innovation in material science. His patents reflect a commitment to enhancing testing methodologies, which can lead to significant advancements in various fields.

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