The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Jul. 03, 2024
Jilin University, Changchun, CN;
Zhichao Ma, Changchun, CN;
Junming Xiong, Changchun, CN;
Guoxiang Shen, Changchun, CN;
Ziyi Wu, Changchun, CN;
Shuai Tong, Changchun, CN;
Zixin Guo, Changchun, CN;
Wei Zhang, Changchun, CN;
Hongcai Xie, Changchun, CN;
Jiazheng Sun, Changchun, CN;
Wenyang Zhao, Changchun, CN;
Zaizheng Yang, Changchun, CN;
Chaofan Li, Changchun, CN;
Yicheng Li, Changchun, CN;
Boyi Kou, Changchun, CN;
Jiakai Li, Changchun, CN;
Yifan Liu, Changchun, CN;
Hongwei Zhao, Changchun, CN;
Luquan Ren, Changchun, CN;
JILIN UNIVERSITY, Changchun, CN;
Abstract
The present invention discloses a rapid dot matrix micro-nano impact indentation testing system. The rapid dot matrix micro-nano impact indentation testing system comprises a three-dimensional electric positioning module, wherein the three-dimensional electric positioning module comprises an XY translation stage and a Z-axis lifting stage; a dot matrix impact indentation module, wherein the dot matrix impact indentation module comprises a three-degree-of-freedom piezoelectric platform arranged on the Z-axis lifting stage, one surface of the three-degree-of-freedom piezoelectric platform is provided with a piezoelectric ceramic actuator, and one end of the piezoelectric ceramic actuator is connected to an indenter; a clamp, wherein the clamp clamps a test piece, and the test piece faces the indenter; and an imaging module, wherein the imaging module comprises a microscope lens. The system can achieve in-situ micro-nano impact indentation test and rapid dot matrix indentation, and has higher indentation precision.