Company Filing History:
Years Active: 2025
Title: Yifan Liu - Innovator in Micro-Nano Impact Indentation Testing Systems.
Introduction
Yifan Liu is a prominent inventor based in Changchun, China. She has made significant contributions to the field of micro-nano testing systems, showcasing her innovative spirit and technical expertise. Her work focuses on developing advanced testing systems that enhance precision and efficiency in material testing.
Latest Patents
Yifan Liu holds a patent for a "Rapid Dot Matrix Micro-Nano Impact Indentation Testing System." This invention discloses a system that includes a three-dimensional electric positioning module, a dot matrix impact indentation module, a clamp for securing test pieces, and an imaging module with a microscope lens. The system is designed to perform in-situ micro-nano impact indentation tests with higher precision, making it a valuable tool in material science.
Career Highlights
Yifan Liu is affiliated with Jilin University, where she continues to advance her research and development efforts. Her innovative work has garnered attention in the scientific community, contributing to the advancement of testing technologies.
Collaborations
Yifan Liu collaborates with notable colleagues, including Zhichao Ma and Junming Xiong. These partnerships enhance her research capabilities and foster a collaborative environment for innovation.
Conclusion
Yifan Liu's contributions to the field of micro-nano impact indentation testing systems exemplify her dedication to innovation and excellence. Her patent and ongoing research at Jilin University position her as a leading figure in her field.