Jilin University

Yifan Liu

Hongwei Zhao

Luquan Ren

Zhichao Ma

Shuai Tong

Hongcai Xie

Jiakai Li

Chaofan Li

Junming Xiong

Wei Zhang

Zixin Guo

Guoxiang Shen

Yicheng Li

Wenyang Zhao

Boyi Kou

Zaizheng Yang

Jiazheng Sun

Ziyi Wu

The present invention discloses a rapid dot matrix micro-nano impact indentation testing system. The rapid dot matrix micro-nano impact indentation testing system comprises a three-dimensional electric positioning module, wherein the three-dimensional electric positioning module comprises an XY translation stage and a Z-axis lifting stage; a dot matrix impact indentation module, wherein the dot matrix impact indentation module comprises a three-degree-of-freedom piezoelectric platform arranged on the Z-axis lifting stage, one surface of the three-degree-of-freedom piezoelectric platform is provided with a piezoelectric ceramic actuator, and one end of the piezoelectric ceramic actuator is connected to an indenter; a clamp, wherein the clamp clamps a test piece, and the test piece faces the indenter; and an imaging module, wherein the imaging module comprises a microscope lens. The system can achieve in-situ micro-nano impact indentation test and rapid dot matrix indentation, and has higher indentation precision.

Rapid dot matrix micro-nano impact indentation testing system

Growing community of inventors

Changchun, China

Yifan Liu