The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Jul. 22, 2024
Jilin University, Changchun, CN;
Zhichao Ma, Changchun, CN;
Zixin Guo, Changchun, CN;
Guoxiang Shen, Changchun, CN;
Jiazheng Sun, Changchun, CN;
Wei Zhang, Changchun, CN;
Hongcai Xie, Changchun, CN;
Shuai Tong, Changchun, CN;
Junming Xiong, Changchun, CN;
Wenyang Zhao, Changchun, CN;
Yicheng Li, Changchun, CN;
Boyi Kou, Changchun, CN;
Zaizheng Yang, Changchun, CN;
Chaofan Li, Changchun, CN;
Jiakai Li, Changchun, CN;
Hongwei Zhao, Changchun, CN;
Luquan Ren, Changchun, CN;
JILIN UNIVERSITY, Changchun, CN;
Abstract
The present invention provides a micro-nano impact indentation testing device and method based on cyclic refrigeration, and relates to the technical field of material property testing. The testing device comprises a pressure rod and a stage for low-temperature micro-nano impact indentation testing, and a refrigeration device for refrigerating and cooling the pressure rod and the stage, wherein the refrigeration device refrigerates the pressure rod and the stage by adopting an embedded channel, a cold conduction wire connected to the pressure rod and the stage and a refrigeration balancer in contact with the cold conduction wire are arranged between the pressure rod and the stage, and the temperature of the pressure rod and the temperature of the stage are stabilized at a common temperature point by the cold conduction wire and the refrigeration balancer together.