The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Jun. 28, 2024
Jilin University, Changchun, CN;
Zhichao MA, Changchun, CN;
Shuai Tong, Changchun, CN;
Guoxiang Shen, Changchun, CN;
Wei Zhang, Changchun, CN;
Hongcai Xie, Changchun, CN;
Junming Xiong, Changchun, CN;
Zixin Guo, Changchun, CN;
Yicheng Li, Changchun, CN;
Jiazheng Sun, Changchun, CN;
Wenyang Zhao, Changchun, CN;
Boyi Kou, Changchun, CN;
Zaizheng Yang, Changchun, CN;
Jiakai Li, Changchun, CN;
Chaofan Li, Changchun, CN;
Hongwei Zhao, Changchun, CN;
Luquan Ren, Changchun, CN;
Chuliang Yan, Changchun, CN;
JILIN UNIVERSITY, Changchun, CN;
Abstract
The present invention discloses a dual cooperative induction temperature control device and a control method for a micro-nano impact indentation tester. The device comprises a first cavity and a second cavity which are respectively arranged in a pressing rod and an stage, wherein a phase change heat storage material is arranged in the two cavities, and a phase change temperature of the phase change heat storage material is a target temperature of a specimen for testing; a first electromagnetic induction heater and a second electromagnetic induction heater which respectively perform non-contact heating on the pressing rod and the stage; and temperature detection mechanisms configured to detect the temperature of the specimen and the indenter. The temperature control device of the present invention combines electromagnetic induction heating and phase change heat storage, thus has the advantages of no interference to the testing of a precise instrument and good temperature stability.