Chuliang Yan

Title: Chuliang Yan and Temperature Control for Micro-Nano Testing

Introduction

Chuliang Yan is an inventor associated with Changchun, China, and Jilin University. His work includes an invention designed to improve temperature control during precision micro-nano impact indentation testing.

Latest Patents

Yan is credited with 1 patent: “Dual Cooperative Induction Temperature Control Device and Control Method for Micro-Nano Impact Indentation Tester.” The invention combines electromagnetic induction heating with phase-change heat storage. Its design places phase-change material in cavities within the pressing rod and stage, with the material’s transition temperature set to the specimen’s target temperature. Separate induction heaters warm the pressing rod and stage without contact, while temperature-detection mechanisms monitor the specimen and indenter. The approach is intended to provide stable temperature control without interfering with precision measurements.

Career Highlights

Yan’s listed patent reflects work on thermal management for micro-nano testing equipment. By coordinating induction heating and heat storage, the device addresses the challenge of maintaining a stable test temperature while preserving the instrument’s measurement conditions.

Collaborations

The patent information lists Zhichao Ma and Shuai Tong as Yan’s coworkers. Yan is associated with Jilin University.

Conclusion

Chuliang Yan’s patented temperature-control system combines non-contact heating and phase-change heat storage to support stable conditions in micro-nano impact indentation testing.