The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jun. 22, 2024
Applicant:

Jilin University, Changchun, CN;

Inventors:

Zhichao MA, Changchun, CN;

Guoxiang Shen, Changchun, CN;

Jiazheng Sun, Changchun, CN;

Wei Zhang, Changchun, CN;

Hongcai Xie, Changchun, CN;

Shuai Tong, Changchun, CN;

Junming Xiong, Changchun, CN;

Zixin Guo, Changchun, CN;

Wenyang Zhao, Changchun, CN;

Cong Li, Changchun, CN;

Yicheng Li, Changchun, CN;

Boyi Kou, Changchun, CN;

Zaizheng Yang, Changchun, CN;

Jiakai Li, Changchun, CN;

Assignee:

JILIN UNIVERSITY, Changchun, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/317 (2006.01);
U.S. Cl.
CPC ...
G01N 3/317 (2013.01); G01N 2203/001 (2013.01); G01N 2203/0051 (2013.01); G01N 2203/0226 (2013.01); G01N 2203/0228 (2013.01); G01N 2203/0244 (2013.01);
Abstract

The present invention relates to an in-situ micro-nano impact indentation testing instrument, falling within the technical field of material micromechanical testing. The instrument comprises a nitrogen generation module, an environmental chamber, a high/low temperature loading module, an optical-infrared in-situ monitoring module, an electromagnetic-piezoelectric coupling impact module, etc. After the nitrogen is introduced into the environmental chamber and the test area is determined by microscopic imaging, the electromagnetic-piezoelectric coupling impact module can drive an indenter to indent a specimen. An acoustic emission sensor embedded in the high/low temperature loading module can monitor the surface crack propagation of the specimen. The optical-infrared in-situ monitoring module can perform real-time high-speed optical imaging and infrared imaging on the impact indentation process. The present invention can perform micro-nano impact indentation testing on the material at high or low temperatures.


Find Patent Forward Citations

Loading…