Company Filing History:
3 out of 641 
1 out of 1,787 
Years Active: 2006-2013
Title: Innovations of Jianxin Zhang
Introduction
Jianxin Zhang is an accomplished inventor based in Santa Clara, CA. He holds a total of 4 patents that showcase his expertise in computer-implemented methods and systems for defect classification and criticality assessment in various applications.
Latest Patents
One of his latest patents involves computer-implemented methods and systems for classifying defects on a specimen. This method includes assigning individual defects detected on the specimen to defect groups based on one or more characteristics of the individual defects. Additionally, it allows users to display information about the defect groups and assign classifications to each group. Another significant patent focuses on methods and systems for determining a defect criticality index (DCI) for defects on wafers. This method determines critical area information surrounding a defect detected on a wafer and calculates a DCI based on various factors, including the defect's location and size.
Career Highlights
Jianxin Zhang has worked with notable companies such as KLA-Tencor Technologies Corporation and KLA-Tencor Corporation. His experience in these organizations has contributed to his innovative work in the field of defect classification and criticality assessment.
Collaborations
Throughout his career, Jianxin has collaborated with talented individuals, including Lisheng Gao and Tong Huang. These collaborations have further enriched his contributions to the field of innovation.
Conclusion
Jianxin Zhang's work in developing methods for classifying defects and determining criticality indices has made a significant impact in his field. His innovative patents reflect his dedication to advancing technology and improving processes in defect management.