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For the Inventor, By the Inventor

Webster, NY, United States of America

Jiann-Rong Lee

This inventor holds 12 USPTO granted patents. Top assignee: Eastman-Kodak Company. Active years: 1998-2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jiann-Rong Lee. Retrieved from https://idiyas.com/inventor/jiann-rong-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 12

% Patents Active = 83.3

Average Co-Inventor Count = 3.1

ph-index = 6

Forward Citations = 148(Granted Patents)


Company Filing History:

goldMedal12 out of 21,604 
 
Eastman-Kodak Company
 patents

Years Active: 1998-2004

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12 patents (USPTO):Explore Patents
1. 6724487 - Apparatus and method for measuring digital imager, package and wafer bow and deviation from flatness (2004-04-20),
2. 6624891 - Interferometric-based external measurement system and method (2003-09-23),
3. 6614534 - Method and apparatus for combined measurement of surface non-uniformity index of refraction variation and thickness variation (2003-09-02),
4. 6587210 - Measurement method and apparatus of an external digital camera imager assembly (2003-07-01),
5. 6587209 - Measurement method and apparatus of an external digital camera imager assembly (2003-07-01),
6. 6522410 - Method for processing low coherence interferometric data (2003-02-18),
7. 6512587 - Measurement method and apparatus of an external digital camera imager assembly (2003-01-28),
8. 6067161 - Apparatus for measuring material thickness profiles (2000-05-23),
9. 6038027 - Method for measuring material thickness profiles (2000-03-14),
10. 6034774 - Method for determining the retardation of a material using non-coherent (2000-03-07),
11. 6034772 - Method for processing interferometric measurement data (2000-03-07),
12. 5757485 - Digital camera image sensor positioning method including a non-coherent (1998-05-26),

Title: The Innovative Contributions of Jiann-Rong Lee

Introduction

Jiann-Rong Lee is a prominent inventor based in Webster, NY, known for his significant contributions to the field of measurement technology. With a total of 12 patents to his name, Lee has made remarkable advancements that enhance the precision and efficiency of various measurement systems.

Latest Patents

Among his latest patents, Lee has developed an "Apparatus and method for measuring digital imager, package and wafer bow and deviation from flatness." This invention includes a fixture for locating a surface of a transparent optical flat relative to a sample surface. It utilizes a low-coherence light interferometer with an optical probe coupled to an XY scanning frame, allowing for detailed surface profiling. Another notable patent is the "Interferometric-based external measurement system and method," which provides an innovative approach to measuring distances between reference surfaces on an object. This system incorporates a low coherence light interferometer and a computer for processing data, ensuring accurate distance measurements.

Career Highlights

Jiann-Rong Lee is currently employed at Eastman Kodak Company, where he continues to push the boundaries of measurement technology. His work has not only contributed to the company's advancements but has also set new standards in the industry.

Collaborations

Lee has collaborated with notable colleagues, including Michael Alan Marcus and Donald R. Lowry. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Jiann-Rong Lee's contributions to measurement technology through his patents and collaborations highlight his role as a leading inventor in the field. His work continues to influence advancements in precision measurement systems, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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