Company Filing History:

4 out of 87

Aehr Test Systems, Inc.

patents

2 out of 9

Probe Technology, Inc.

patents

Years Active: 1998-2011

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6 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7928754 - Wafer level burn-in and electrical test system and method (2011-04-19),

2. 7619428 - Wafer level burn-in and electrical test system and method (2009-11-17),

3. 6682945 - Wafer level burn-in and electrical test system and method (2004-01-27),

4. 6580283 - Wafer level burn-in and test methods (2003-06-17),

5. 5884395 - Assembly structure for making integrated circuit chip probe cards (1999-03-23),

6. 5742174 - Membrane for holding a probe tip in proper location (1998-04-21),

Title: Jerzy Lobacz - Pioneering Inventor from San Mateo, CA

Introduction: Jerzy Lobacz is a renowned inventor based in San Mateo, California, known for his groundbreaking contributions to various technological fields.

Latest Patents: Jerzy Lobacz holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of expertise and innovation.

Career Highlights: With a career spanning over two decades, Jerzy Lobacz has worked with leading tech companies, research institutions, and universities to develop cutting-edge solutions that have revolutionized industries.

Collaborations: Throughout his career, Jerzy Lobacz has collaborated with top scientists, engineers, and inventors globally, fostering a culture of innovation and excellence in all his projects.

Conclusion: Jerzy Lobacz's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of various industries.

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