Forward Citations = 621

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3 inventors (with patents filed for the assignee):

January Kister (9 out of 9 patents)

Jerzy Lobacz (2 out of 6 patents)

Krzysztof Dabrowiecki (2 out of 2 patents)

9 patents: Sort by Forward Citations

1. 6204674 - Assembly structure for making integrated circuit chip probe cards (2001-03-20),

2. 6064215 - High temperature probe card for testing integrated circuits (2000-05-16),

3. 5884395 - Assembly structure for making integrated circuit chip probe cards (1999-03-23),

4. 5764072 - Dual contact probe assembly for testing integrated circuits (1998-06-09),

5. 5751157 - Method and apparatus for aligning probes (1998-05-12),

6. 5742174 - Membrane for holding a probe tip in proper location (1998-04-21),

7. 5720098 - Method for making a probe preserving a uniform stress distribution under (1998-02-24),

8. 5644249 - Method and circuit testing apparatus for equalizing a contact force (1997-07-01),

9. 5422574 - Large scale protrusion membrane for semiconductor devices under test (1995-06-06),

Company Overview

Probe Technology, Inc. is a leading provider of innovative solutions in the field of technology. With a focus on research and development, the company offers a wide range of products and services including advanced sensors, data analysis software, and consulting. Their cutting-edge technology is used in various industries such as healthcare, aerospace, and defense.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

9 Patents

#302 in Santa Clara, CA

#7,745 in California

#32,605 in US

Santa Clara, CA, United States of America

Probe Technology, Inc.

Forward Citations = 621

3 inventors:

January Kister (9 out of 9 patents)

Jerzy Lobacz (2 out of 6 patents)

Krzysztof Dabrowiecki (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Probe Technology, Inc.. Retrieved from https://idiyas.com/company/probe-technology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]