Krzysztof Dabrowiecki

Title: Krzysztof Dabrowiecki: Innovator in Integrated Circuit Testing

Introduction

Krzysztof Dabrowiecki is a notable inventor based in San Leandro, CA (US). He has made significant contributions to the field of integrated circuit testing, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

One of his latest patents is an assembly structure for making integrated circuit chip probe cards. This invention proposes a unique assembly structure designed to build probe cards for testing square integrated circuit chips. The test probe card assembly structure features one or more wings positioned at 90° angles to each other, allowing probes to be laid in a parallel manner for attachment to a probe card. This design ensures that probes touch contacts directly, eliminating the fan-out angle and maintaining consistent force across the probe tips. Additionally, the structure includes an epoxy groove that controls epoxy flow, ensuring the probes remain aligned in the correct plane and preventing variance in beam length.

Career Highlights

Krzysztof Dabrowiecki has been instrumental in advancing the technology used in probe cards, which are essential for testing integrated circuits. His work has improved the reliability and efficiency of testing processes, making significant impacts in the semiconductor industry.

Collaborations

He has collaborated with notable coworkers such as January Kister and Jerzy Lobacz, contributing to the innovative environment at Probe Technology, Inc.

Conclusion

Krzysztof Dabrowiecki's contributions to integrated circuit testing through his patents and collaborative efforts highlight his role as a key innovator in the field. His work continues to influence advancements in semiconductor technology.