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USPTO Data Jan 1 1976 - Oct 27 2026
89 Patents
#28 in Fremont, CA
#976 in California
#4,198 in US
#8,623 in the World
Aehr Test Systems, Inc.
Forward Citations = 960
36 inventors:
Fremont, CA, United States of America
Aehr Test Systems, Inc.
Calculating rank
% Expired Patents = 3.4
EPO Patents = 3
Forward Citations = 960
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36 inventors (with patents filed for the assignee):
Jovan Jovanovic (55 out of 58 patents)
Donald Paul Richmond, Ii (47 out of 54 patents)
Scott E Lindsey (46 out of 51 patents)
4. Kenneth W Deboe (33 out of 34 patents)
5. Steven C Steps (23 out of 23 patents)
6. Frank Otto Uher (20 out of 23 patents)
7. Mark Charles Carbone (17 out of 33 patents)
8. David S Hendrickson (14 out of 16 patents)
9. Thomas T Maenner (13 out of 14 patents)
10. Patrick M Shepherd (13 out of 14 patents)
11. Paul W Burke (12 out of 13 patents)
12. James F Tomic (12 out of 13 patents)
13. Long V Vu (12 out of 13 patents)
14. Seang P Malathong (12 out of 12 patents)
15. Alberto Calderon (12 out of 12 patents)
Core Competencies:
Electronics Tester
Integrated Circuit Testing
Thermal Control
Burn-In Testing
Signal Distribution
Voltage Compensation
Current Amplification
Wafer Level Testing
Pressure Relief Valve
Thermal Chuck
Contact Layout
Test Components
89 patents:
1. 12761288 - Method and system for thermal control of devices in an electronics tester (2026-10-13),
3. 12326472 - System for testing an integrated circuit of a device and its method of use (2025-06-10),
5. 12292484 - Method and system for thermal control of devices in an electronics tester (2025-05-06),
12. 12007451 - Method and system for thermal control of devices in an electronics tester (2024-06-11),
Company Overview
Aehr Test Systems, Inc. is a leading provider of advanced test and burn-in solutions for the semiconductor industry, specializing in electronics testing technologies. Headquartered in Fremont, California, the company focuses on developing innovative systems for integrated circuit testing, including thermal control, signal distribution, and voltage compensation. Their expertise extends to wafer level testing, enabling efficient and reliable performance assessments of electronic components, which are crucial for the advancement of modern electronics.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Aehr Test Systems, Inc.. Retrieved from https://idiyas.com/company/aehr-test-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
3 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]