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For the Inventor, By the Inventor

Fremont, CA, United States of America

Aehr Test Systems, Inc.


USPTO Granted Patents = 88

% Expired Patents = 3.4


Forward Citations = 930

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36 inventors (with patents filed for the assignee):

goldMedal Jovan Jovanovic (54 out of 57 patents)

silverMedal Donald Paul Richmond, Ii (47 out of 54 patents)

bronzeMedal Scott E Lindsey (46 out of 51 patents)

4.  Kenneth W Deboe (32 out of 33 patents)

5.  Steven C Steps (22 out of 22 patents)

6.  Frank Otto Uher (20 out of 23 patents)

7.  Mark Charles Carbone (17 out of 33 patents)

8.  David S Hendrickson (14 out of 16 patents)

9.  Thomas T Maenner (13 out of 14 patents)

10.  Patrick M Shepherd (13 out of 14 patents)

11.  Paul W Burke (12 out of 13 patents)

12.  James F Tomic (12 out of 13 patents)

13.  Long V Vu (12 out of 13 patents)

14.  Seang P Malathong (12 out of 12 patents)

15.  Alberto Calderon (12 out of 12 patents)


Core Competencies:
Electronics Tester
Integrated Circuit Testing
Thermal Control
Burn-In Testing
Signal Distribution
Voltage Compensation
Current Amplification
Wafer Level Testing
Pressure Relief Valve
Thermal Chuck
Contact Layout
Test Components

88 patents:

1. 12584958 - Electronics tester (2026-03-24),
2. 12326472 - System for testing an integrated circuit of a device and its method of use (2025-06-10),
3. 12298328 - Controlling alignment during a thermal cycle (2025-05-13),
4. 12292484 - Method and system for thermal control of devices in an electronics tester (2025-05-06),
5. 12282062 - Electronics tester (2025-04-21),
6. 12265136 - Method and system for thermal control of devices in electronics tester (2025-04-01),
7. 12253560 - Electronics tester (2025-03-18),
8. 12228609 - Electronics tester (2025-02-18),
9. 12169217 - Electronics tester (2024-12-17),
10. 12163999 - Apparatus for testing electronic devices (2024-12-10),
11. 12007451 - Method and system for thermal control of devices in an electronics tester (2024-06-11),
12. 11977098 - System for testing an integrated circuit of a device and its method of use (2024-05-07),
13. 11860221 - Apparatus for testing electronic devices (2024-01-02),
14. 11835575 - Electronics tester (2023-12-05),
15. 11821940 - Electronics tester (2023-11-21),
AEHR Test Systems, Inc. is a leading provider of test and burn-in solutions for the semiconductor industry. With over 40 years of experience, AEHR Test Systems offers innovative and reliable test systems designed to improve production yields and reduce manufacturing costs. Their solutions include advanced wafer-level test and burn-in systems, as well as comprehensive testing and service capabilities. AEHR Test Systems is dedicated to delivering high-quality and efficient testing solutions to semiconductor manufacturers worldwide.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Sep 15 2026

Aehr Test Systems, Inc.
88 Patents

#28 in Fremont, CA

#983 in California

#4,225 in US

#8,653 in the World

Fremont, CA (US)
Fremont, CA, United States of America

Aehr Test Systems, Inc.

Forward Citations = 930

36 inventors:

goldMedal Jovan Jovanovic (54 out of 57 patents)

silverMedal Donald Paul Richmond, Ii (47 out of 54 patents)

bronzeMedal Scott E Lindsey (46 out of 51 patents)

4.  Kenneth W Deboe (32 out of 33 patents)

5.  Steven C Steps (22 out of 22 patents)

Please report any incorrect information to [email protected]
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