For the Inventor, By the Inventor

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Fremont, CA, United States of America

Aehr Test Systems, Inc.

USPTO Granted Patents = 87

EPO Patents = 3

Trademarks = 1

Forward Citations = 901

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35 inventors (with patents filed for the assignee):

Jovan Jovanovic (53 out of 56 patents)

Donald Paul Richmond, Ii (47 out of 54 patents)

Scott E Lindsey (45 out of 50 patents)

4. Kenneth W Deboe (32 out of 33 patents)

5. Steven C Steps (22 out of 22 patents)

6. Frank Otto Uher (20 out of 23 patents)

7. Mark Charles Carbone (17 out of 33 patents)

8. David S Hendrickson (14 out of 16 patents)

9. Thomas T Maenner (13 out of 14 patents)

10. Patrick M Shepherd (13 out of 14 patents)

11. Paul W Burke (12 out of 13 patents)

12. James F Tomic (12 out of 13 patents)

13. Long V Vu (12 out of 13 patents)

14. Seang P Malathong (12 out of 12 patents)

15. Alberto Calderon (12 out of 12 patents)

Core Competencies:

Integrated Circuits

Thermal Control

Electronics Testing

Pressure Relief Valves

Current Amplification

Substrate Contact

Signal Distribution Boards

Thermal Chucks

Power Saving States

Current Configurations

Alignment Control

Feedthrough Modules

87 patents: Sort by Forward Citations

1. 12326472 - System for testing an integrated circuit of a device and its method of use (2025-06-10),

2. 12298328 - Controlling alignment during a thermal cycle (2025-05-13),

3. 12292484 - Method and system for thermal control of devices in an electronics tester (2025-05-06),

4. 12282062 - Electronics tester (2025-04-21),

5. 12265136 - Method and system for thermal control of devices in electronics tester (2025-04-01),

6. 12253560 - Electronics tester (2025-03-18),

7. 12228609 - Electronics tester (2025-02-18),

8. 12169217 - Electronics tester (2024-12-17),

9. 12163999 - Apparatus for testing electronic devices (2024-12-10),

10. 12007451 - Method and system for thermal control of devices in an electronics tester (2024-06-11),

11. 11977098 - System for testing an integrated circuit of a device and its method of use (2024-05-07),

12. 11860221 - Apparatus for testing electronic devices (2024-01-02),

13. 11835575 - Electronics tester (2023-12-05),

14. 11821940 - Electronics tester (2023-11-21),

15. 11635459 - Electronics tester (2023-04-25),

AEHR Test Systems, Inc. is a leading provider of test and burn-in solutions for the semiconductor industry. With over 40 years of experience, AEHR Test Systems offers innovative and reliable test systems designed to improve production yields and reduce manufacturing costs. Their solutions include advanced wafer-level test and burn-in systems, as well as comprehensive testing and service capabilities. AEHR Test Systems is dedicated to delivering high-quality and efficient testing solutions to semiconductor manufacturers worldwide.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 23 2025

87 Patents

#25 in Fremont, CA

#978 in California

#4,130 in US

#8,498 in the World

Fremont, CA, United States of America

Aehr Test Systems, Inc.

Forward Citations = 901

35 inventors:

Jovan Jovanovic (53 out of 56 patents)

Donald Paul Richmond, Ii (47 out of 54 patents)

Scott E Lindsey (45 out of 50 patents)

4. Kenneth W Deboe (32 out of 33 patents)

5. Steven C Steps (22 out of 22 patents)

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