Jen-Chieh Lo

Title: Innovations of Inventor Jen-Chieh Lo

Introduction

Jen-Chieh Lo is a prominent inventor based in New Taipei, Taiwan. He has made significant contributions to the field of measurement technology, holding a total of six patents. His work focuses on methods for validating measurement data, which are crucial for ensuring accuracy in various applications.

Latest Patents

One of Jen-Chieh Lo's latest patents is a method for validating measurement data. This method involves receiving a substrate with a material feature formed according to a design feature. The process includes applying a source signal to the material feature and collecting a response signal using a measurement tool. A computer connected to the measurement tool calculates a simulated response signal based on the design feature. If the difference between the collected response signal and the simulated response signal exceeds a predetermined value, the measurement tool is prompted to re-measure the material feature. This innovative approach enhances the reliability of measurement data.

Career Highlights

Jen-Chieh Lo is currently employed at Taiwan Semiconductor Manufacturing Company Limited, where he continues to develop and refine his innovative methods. His expertise in measurement technology has positioned him as a valuable asset in the semiconductor industry.

Collaborations

Throughout his career, Jen-Chieh Lo has collaborated with notable colleagues, including Ying-Chou Cheng and Ru-Gun Liu. These partnerships have contributed to the advancement of measurement techniques and the successful implementation of his patented methods.

Conclusion

Jen-Chieh Lo's contributions to measurement technology through his innovative patents demonstrate his commitment to enhancing accuracy in the field. His work at Taiwan Semiconductor Manufacturing Company Limited and collaborations with esteemed colleagues further highlight his impact on the industry.