The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Oct. 03, 2013
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;
I-Chang Shih, Zhubei, TW;
Jen-Chieh Lo, New Taipei, TW;
Tzu-Chin Lin, Hsinchu, TW;
Ping-Chieh Wu, New Taipei, TW;
Ying-Chou Cheng, Zhubei, TW;
Chih-Ming Lai, Hsinchu, TW;
Ru-Gun Liu, Zhubei, TW;
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., Hsin-Chu, TW;
Abstract
A method and computer program are provided for analyzing a set of layers within an integrated circuit design to determine a set of critical points for each layer within the set of layers. The critical points are based at least in part on manufacturer specific process parameters. The method includes assigning a critical point value to each of the critical points within each set of critical points, analyzing a path through the integrated circuit design across multiple integrated circuit design layers, and determining a sum of critical point values of each critical point along the path.