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For the Inventor, By the Inventor

Rochester, MN, United States of America

Jeffrey Milton Scherer

USPTO Granted Patents = 13

Average Co-Inventor Count = 3.9

ph-index = 3

Forward Citations = 70(Granted Patents)


Company Filing History:

goldMedal13 out of 164,219 
 
International Business Machines Corporation
 patents

Years Active: 2010-2019

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13 patents (USPTO):Explore Patents
1. 10311966 - On-chip diagnostic circuitry monitoring multiple cycles of signal samples (2019-06-04),
2. 9715905 - Detecting maximum voltage between multiple power supplies for memory testing (2017-07-25),
3. 9087607 - Implementing sense amplifier for sensing local write driver with bootstrap write assist for SRAM arrays (2015-07-21),
4. 9007858 - SRAM global precharge, discharge, and sense (2015-04-14),
5. 9007857 - SRAM global precharge, discharge, and sense (2015-04-14),
6. 8659937 - Implementing low power write disabled local evaluation for SRAM (2014-02-25),
7. 8593890 - Implementing supply and source write assist for SRAM arrays (2013-11-26),
8. 8331180 - Active bit line droop for read assist (2012-12-11),
9. 8274848 - Level shifter for use with memory arrays (2012-09-25),
10. 8213249 - Implementing low power data predicting local evaluation for double pumped arrays (2012-07-03),
11. 7983080 - Non-body contacted sense amplifier with negligible history effect (2011-07-19),
12. 7783943 - Method and apparatus for testing a random access memory device (2010-08-24),
13. 7751266 - High performance read bypass test for SRAM circuits (2010-07-06),

Title: The Innovations of Jeffrey Milton Scherer

Introduction

Jeffrey Milton Scherer is a prominent inventor based in Rochester, MN (US). He has made significant contributions to the field of technology, holding a total of 13 patents. His work primarily focuses on advanced diagnostic circuitry and memory testing systems.

Latest Patents

One of Scherer's latest patents is titled "On-chip diagnostic circuitry monitoring multiple cycles of signal samples." This invention provides a system and integrated circuits designed to determine performance metrics over multiple cycles of an input signal using on-chip diagnostic circuitry. The system includes a trigger generation module that produces a trigger signal, along with diagnostic circuitry that comprises a memory with multiple data lines and delay elements. This innovative design allows for the acquisition of samples from various cycles of the input signal.

Another notable patent is "Detecting maximum voltage between multiple power supplies for memory testing." This invention outlines a computing system and method for identifying the maximum voltage power supply necessary for effective memory testing. The method utilizes a sense amplifier to generate drive signals that indicate which of two voltages is greater, thereby optimizing the power supply used in conjunction with memory.

Career Highlights

Jeffrey Scherer has built a successful career at International Business Machines Corporation (IBM), where he has been instrumental in developing cutting-edge technologies. His expertise in diagnostic circuitry and memory systems has positioned him as a key player in the tech industry.

Collaborations

Throughout his career, Scherer has collaborated with talented individuals such as Chad Allen Adams and Elizabeth Lair Gerhard. These partnerships have fostered innovation and contributed to the advancement of technology in their respective fields.

Conclusion

Jeffrey Milton Scherer is a distinguished inventor whose work has significantly impacted the technology landscape. His patents reflect a commitment to innovation and excellence in engineering.

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