The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2010

Filed:

Jun. 26, 2008
Applicants:

Chad Allen Adams, Byron, MN (US);

Derick Gardner Behrends, Rochester, MN (US);

Daniel Mark Nelson, Rochester, MN (US);

Jeffrey Milton Scherer, Rochester, MN (US);

Inventors:

Chad Allen Adams, Byron, MN (US);

Derick Gardner Behrends, Rochester, MN (US);

Daniel Mark Nelson, Rochester, MN (US);

Jeffrey Milton Scherer, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A design structure embodied in a machine readable medium used in a design process and an integrated circuit for high performance SRAM (Static Random Access Memory) read bypass for BIST (built-in self-test). The design structure and integrated structure includes a dynamic to static conversion unit for a read output of an SRAM array, and a test bypass unit integrated into the dynamic to static conversion unit, so as to allow the read output of the SRAM array to pass through in a non-test mode without impacting performance, and bypass the read output of the SRAM array and allow a test signal to pass though in a test mode.


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