Portland, OR, United States of America

Jason Harrison Arjavac

USPTO Granted Patents = 18 


Average Co-Inventor Count = 3.2

ph-index = 7

Forward Citations = 105(Granted Patents)


Location History:

  • Portland, OR (US) (2005 - 2017)
  • Hillsboro, OR (US) (2013 - 2022)

Company Filing History:


Years Active: 2005-2025

Loading Chart...
Loading Chart...
18 patents (USPTO):Explore Patents

Title: Jason Harrison Arjavac: Innovator in Microscopy and Milling Technologies

Introduction

Jason Harrison Arjavac is a prominent inventor based in Portland, OR (US). He has made significant contributions to the fields of microscopy and milling technologies, holding a total of 18 patents. His work focuses on improving the accuracy and efficiency of milling processes through innovative methods and systems.

Latest Patents

One of Arjavac's latest patents is titled "Microscopy feedback for improved milling accuracy." This invention discloses methods and apparatus for integrating image-based metrology into a milling workflow. The process involves performing a first ion beam milling operation to an edge at a distance from a final target position on a sample. An SEM image is utilized to determine the distance between the milled edge and a reference structure on the sample. Based on this distance, the ion beam is adjusted to perform a second milling operation, ensuring the milled edge reaches the final target position. The patent also discusses extensions to iterative procedures and various geometric configurations and corrections applicable in manufacturing and analytic applications across multiple fields, including read-write head manufacture and TEM sample preparation.

Another notable patent is "Dose-based end-pointing for low-kV FIB milling in TEM sample preparation." This invention outlines a method, system, and computer-readable medium for forming transmission electron microscopy sample lamellae using a focused ion beam. The process includes directing a high-energy focused ion beam toward a bulk volume of material and milling away the unwanted volume to produce an unfinished sample lamella. After characterizing the removal rate of the focused ion beam, a low-energy focused ion beam is directed toward the unfinished sample lamella for a predetermined milling time to deliver a specified dose of ions per area. This method effectively removes at least a portion of the damage layer, resulting in a finished sample lamella that includes features of interest.

Career Highlights

Jason Arjavac is currently employed at FEI Company, where he continues to develop innovative solutions in the field of microscopy and milling technologies. His expertise and dedication to advancing these technologies have positioned him as a key figure in his industry.

Collaborations

Throughout his career, Arjavac has collaborated with notable colleagues, including Pei Zou and Gerhard Daniel. These collaborations have further enhanced his work and contributed to the development of cutting-edge technologies.

Conclusion

Jason Harrison Arjav

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…