Pleasanton, CA, United States of America

Janghwan Lee

This inventor holds 29 USPTO granted patents and 22 published patent applications and 13 EPO patents, primarily in Defect Detection. Top assignees: Samsung Display Co., Ltd., Samsung Display Co., Ltd., Samsung Electronics Co., Ltd.. Active years: 2011-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Janghwan Lee. Retrieved from https://idiyas.com/inventor/janghwan-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 29 

% Patents Active = 93.1

 

Average Co-Inventor Count = 1.6

ph-index = 3

Forward Citations = 82(Granted Patents)


Location History:

  • San Jose, CA (US) (2016)
  • Pleasanton, CA (US) (2011 - 2024)

Company Filing History:


Years Active: 2011-2026

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Areas of Expertise:
Manufacturing Defects
Synthetic Image Generation
Machine Learning
Adversarial Training
Defect Classification
Data Augmentation
Video Anomaly Detection
Knowledge Distillation
Mura Detection
Image-Based Identification
Distance Metrics
Multimodal Fusion
29 patents (USPTO):Explore Patents

Title: Innovations by Janghwan Lee in Manufacturing Processes

Introduction

Janghwan Lee, based in Pleasanton, CA, is a prolific inventor with a remarkable portfolio of 19 patents. His contributions primarily focus on enhancing manufacturing processes through advanced systems and methods, particularly in the areas of defect visibility regression and image-based defect identification.

Latest Patents

Among his latest inventions are:

1. **Systems and Methods for Concept Intervals Clustering for Defect Visibility Regression**: This invention involves a processor that analyzes a range of input vectors and trains machine learning models based on clustered time intervals. The processor is capable of making predictions about products manufactured through various processes, significantly improving defect visibility.

2. **Image-Based Defects Identification and Semi-Supervised Localization**: This innovative system employs multiple neural networks to classify manufacturing defects. By allowing independent training of different data inputs, the system enables effective defect classification even when data types are not aligned, showcasing flexibility in handling diverse manufacturing data.

Career Highlights

Janghwan Lee has collaborated with reputed companies, including Samsung Display Co., Ltd. and Shenzhen TCL New Technology Ltd. His experience in leading-edge companies has equipped him with the expertise necessary for driving innovation in the manufacturing sector.

Collaborations

Throughout his career, Janghwan has worked alongside talented professionals, including Sai MarapaReddy and Shuhui Qu, contributing to the development of sophisticated manufacturing technologies and methodologies.

Conclusion

Janghwan Lee's inventive work continues to influence the manufacturing landscape significantly. His patents reflect a deep understanding of complex systems and a commitment to harnessing technology for improved defect detection and processing efficiency in manufacturing environments. As he progresses in his career, further innovations are expected to emerge, solidifying his legacy in this vital industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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