The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Apr. 16, 2024
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Rahul Shenoy, San Jose, CA (US);

Kaushik Balakrishnan, San Jose, CA (US);

Qisen Cheng, San Jose, CA (US);

Janghwan Lee, San Jose, CA (US);

Yongmoon Jeon, Gyeonggi-do, KR;

Deokyeong Jeong, Gyeonggi-do, KR;

Euiyoung Jeong, Gyeonggi-do, KR;

Jaewon Kim, Gyeonggi-do, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/60 (2024.01); G06T 5/70 (2024.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 5/60 (2024.01); G06T 5/70 (2024.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A method may include applying, by a processor, noise to a first image to generate a first noisy image, removing, by the processor, at least a portion of the noise from the first noisy image based on a neural network, selecting, by the processor, during the removing of the noise, a denoising path on the neural network corresponding to a greatest difference between a first intermediate denoised image and a second intermediate denoised image, and generating, by the processor, a second image based on the selected denoising path.


Find Patent Forward Citations

Shenoy, Rahul. (2026). Methods for sampling synthetic defect image generation (U.S. Patent No. 12657668). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12657668

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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