Gyeonggi-do, South Korea

Euiyoung Jeong

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Euiyoung Jeong. Retrieved from https://idiyas.com/inventor/euiyoung-jeong-ucqdeprn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Euiyoung Jeong: Innovator in Synthetic Defect Image Generation

Introduction

Euiyoung Jeong is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of image processing, particularly in the generation of synthetic defect images. His innovative approach has garnered attention in the technology sector.

Latest Patents

Euiyoung Jeong holds a patent for "Methods for sampling synthetic defect image generation." This method involves applying noise to a first image to create a first noisy image. It also includes removing a portion of the noise based on a neural network. The process selects a denoising path corresponding to the greatest difference between two intermediate denoised images. Finally, it generates a second image based on the selected denoising path. He has 1 patent to his name.

Career Highlights

Euiyoung Jeong is currently employed at Samsung Display Co., Ltd. His work at this leading technology company has allowed him to explore and develop advanced imaging techniques. His contributions have been instrumental in enhancing the quality of display technologies.

Collaborations

Euiyoung has collaborated with talented individuals such as Rahul Shenoy and Kaushik Balakrishnan. These partnerships have fostered innovation and creativity in their projects.

Conclusion

Euiyoung Jeong is a prominent figure in the realm of synthetic defect image generation. His innovative methods and collaborations continue to influence advancements in image processing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…