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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12518169 B1

PDFFull Text
Date of Patent:
Jan. 06, 2026

Filed:

Jul. 02, 2021

Systems and methods for sample generation for identifying manufacturing defects

Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Shuhui Qu, Fremont, CA (US);

Janghwan Lee, Pleasanton, CA (US);

Yan Kang, Sunnyvale, CA (US);

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:

Womble Bond Dickinson (US) LLP

Primary Examiner:

Alexey Shmatov

Assistant Examiner:

Clint undefined Mullinax

Int. Cl.
CPC ...
G06N 3/088 (2023.01); G06F 18/21 (2023.01); G06F 18/2113 (2023.01); G06F 18/214 (2023.01); G06N 3/063 (2023.01); G06V 10/88 (2022.01);
U.S. Cl.
CPC ...
G06N 3/088 (2013.01); G06F 18/2113 (2023.01); G06F 18/214 (2023.01); G06F 18/217 (2023.01); G06N 3/063 (2013.01); G06V 10/898 (2022.01);
Abstract

Systems and methods for classifying products are disclosed. A first data sample having a first portion and a second portion is identified from a training dataset. A first mask is generated based on the first data sample, where the first mask is associated with the first portion of the first data sample. A second data sample is generated based on a noise input. The first mask is applied to the second data sample for outputting a third portion of the second data sample. The third portion of the second data sample is combined with the second portion of the first data sample for generating a first combined data sample. Confidence and classification of the first combined data sample are predicted. The first combined data sample is added to the training dataset in response to predicting the confidence and the classification.

Find Patent Forward Citations

Qu, Shuhui. (2026). Systems and methods for sample generation for identifying manufacturing defects (U.S. Patent No. 12518169). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12518169

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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