Sunnyvale, CA, United States of America

Yan Kang

This inventor holds 6 USPTO granted patents and 1 published patent application and 2 EPO patents. Top assignees: Samsung Display Co., Ltd., Samsung Display Co., Ltd.. Active years: 2023-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yan Kang. Retrieved from https://idiyas.com/inventor/yan-kang-2q9792b3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6 

% Patents Active = 83.3

 

Average Co-Inventor Count = 4.4

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2023-2026

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6 patents (USPTO):Explore Patents

Title: Yan Kang: Innovator in Manufacturing Defect Classification

Introduction

Yan Kang is a prominent inventor based in Sunnyvale, CA, who has made significant contributions to the field of manufacturing defect classification. With a total of 6 patents to his name, he has developed innovative systems and methods that enhance the identification of manufacturing defects.

Latest Patents

Yan Kang's latest patents include groundbreaking technologies such as "Systems and methods for sample generation for identifying manufacturing defects." This patent discloses a method for generating a first data sample and applying a mask to classify products effectively. Another notable patent is "Image-based defects identification and semi-supervised localization," which presents a system utilizing multiple neural networks to classify manufacturing defects without the need for aligned data.

Career Highlights

Yan Kang is currently employed at Samsung Display Co., Ltd., where he continues to push the boundaries of innovation in manufacturing processes. His work focuses on improving defect classification systems, which are crucial for maintaining product quality in manufacturing.

Collaborations

Throughout his career, Yan has collaborated with talented individuals such as Janghwan Lee and Shuhui Qu, who contribute to the advancement of their projects and research.

Conclusion

Yan Kang's contributions to the field of manufacturing defect classification demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of complex systems and a drive to improve manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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