The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

May. 03, 2021
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Shuhui Qu, Fremont, CA (US);

Janghwan Lee, Pleasanton, CA (US);

Yan Kang, Sunnyvale, CA (US);

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 3/045 (2023.01); G06N 3/08 (2023.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/04 (2013.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01);
Abstract

Systems and method for classifying manufacturing defects are disclosed. In one embodiment, a first data sample satisfying a first criterion is identified from a training dataset, and the first data sample is removed from the training dataset. A filtered training dataset including a second data sample is output. A first machine learning model is trained with the filtered training dataset. A second machine learning model is trained based on at least one of the first data sample or the second data sample. Product data associated with a manufactured product is received, and the second machine learning model is invoked for predicting confidence of the product data. In response to predicting the confidence of the product data, the first machine learning model is invoked for generating a classification based the product data.


Find Patent Forward Citations

Qu, Shuhui. (2026). Systems and methods for identifying manufacturing defects (U.S. Patent No. 12718139). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12718139

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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