The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Jun. 22, 2023
Samsung Display Co., Ltd., Yongin-si, KR;
Janghwan Lee, Pleasanton, CA (US);
Samsung Display Co., Ltd., Yongin-si, KR;
Abstract
A method for detecting a fault includes: receiving a plurality of time-series sensor data obtained in one or more manufacturing processes of an electronic device; arranging the plurality of time-series sensor data in a two-dimensional (2D) data array; providing the 2D data array to a convolutional neural network model; identifying a pattern in the 2D data array that correlates to a fault condition using the convolutional neural network model; providing a fault indicator of the fault condition in the one or more manufacturing processes of the electronic device; and determining that the electronic device includes a fault based on the fault indicator. The 2D data array has a dimension of an input data to the convolutional neural network model.