James M Hannan

Title: The Innovative Contributions of James M Hannan

Introduction

James M Hannan is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of semiconductor testing, holding a total of 5 patents. His work has been instrumental in advancing technologies that enhance the efficiency and effectiveness of semiconductor integrated circuit testing.

Latest Patents

Hannan's latest patents include an "Interface structure for semiconductor integrated circuit test equipment." This invention provides a robust interface structure for connecting a test head interface to a device under test (DUT) interface. It features a first frame member and a second frame member, along with a spacer that secures them together. The design includes cable assembly headers that ensure electrical insulation and connectivity between terminal members.

Another significant patent is the "Apparatus for testing semiconductor integrated circuit devices in wafer form." This apparatus comprises a test head, a probe card support mechanism, and a wafer prober. The innovative design allows for efficient testing of semiconductor devices by presenting successive wafers to the test head and facilitating the movement of the probe card support mechanism.

Career Highlights

James M Hannan is currently associated with Credence Systems Corporation, where he continues to develop cutting-edge technologies in semiconductor testing. His expertise and innovative mindset have positioned him as a key player in the industry.

Collaborations

Hannan has collaborated with notable coworkers such as Jeffrey S McMullin and John J Harsany. Their combined efforts have contributed to the advancement of semiconductor testing technologies.

Conclusion

James M Hannan's contributions to the field of semiconductor testing through his patents and collaborations highlight his innovative spirit and dedication to advancing technology. His work continues to impact the industry positively.