James Chen

Title: The Innovative Contributions of James Chen

Introduction

James Chen is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of technology, particularly in the area of film layer characterization. With a total of nine patents to his name, Chen's work has advanced the understanding and measurement of materials in various applications.

Latest Patents

One of Chen's latest patents is titled "Characterizing and measuring in small boxes using XPS with multiple measurements." This innovative system is designed to characterize a film layer within a measurement box. The system utilizes a first X-ray beam to obtain a mixing fraction that represents the fraction of the beam inside the measurement box of a wafer sample. The measurement box is a bore structure over a substrate containing a film layer. The system also calculates a contribution value for the measurement box, which represents a species signal outside the box that contributes to the same species signal inside. Ultimately, the system determines a measurement value of the film layer based on the detection signal, contribution value, and mixing fraction.

Career Highlights

Throughout his career, James Chen has worked with notable companies such as Taiwan Semiconductor Manufacturing Company Ltd. and Lite-On Technology Corporation. His experience in these leading firms has allowed him to refine his skills and contribute to groundbreaking innovations in the semiconductor industry.

Collaborations

Chen has collaborated with esteemed colleagues, including Kenneth Lin and Kuo-Wei Lin. These partnerships have fostered a creative environment that has led to the development of advanced technologies and solutions.

Conclusion

James Chen's contributions to the field of technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the industry, paving the way for future innovations.